번호
저자
제목
저널명
vol
issue
page
year
22
Whikun Yi, Taewon Jeong, Segi Yu, Jeonghee Lee, Sunghwan Jin, Jungna Heo, and J.M. Kim
 Study of secondary-electron emission from thermally grown SiO2 films on Si
Thin Solid Films
397
2
170-175
2001
21
W.K. Yi, S.G. Yu, J.H. Lee, S.H. Jin, T.W. Jeong, J.N. Heo, J.M. Kim, N.S. Lee, J.W. Kim, J.U. Jang, H.W. Lee, J.H. Choi, Y.J. Park, and J.U. Jung
 Improved luminance of a moving picture in field emission display operating with a microchannel plate
Electronics Letters
37
14
879-881
2001
20
Whikun Yi
 Anisotropic etching of polysilicon in a Cl2/CH3Br/O2 plasma
J. Electrochem. Soc.
148
8
G452
2001
19
Jeonghee Lee, Taewon Jeong, SeGi Yu, Sunghwan Jin, Jungna Heo, Whikun Yi, and Jongmin Kim
 Secondary electron emission of the MgO thin film prepared by spin coating method
J. Vac. Sci. Technol. B
19
4
1366
2001
18
Taewon Jeong, Jeonghee Lee, SeGi Yu, Sunghwan Jin, Jungna Heo, Whikun Yi, D. Jeon, and J.M. Kim
 Secondary electron emission characteristics for sol-gel based SiO2 thin films
J. Vac. Sci. Technol. B
19
3
866
2001
17
Jeonghee Lee, Taewon Jeong, SeGi Yu, Sunghwan Jin, Jungna Heo, Whikun Yi, Jongmin Kim, and D. Jeon
 Thickness effect on secondary electron emission of MgO layers
Appl. Surf. Sci
174
62
2001
16
Intaek Han, Taewon Jeong, Yoonseong Woo, Jeonghee Lee, Sunghwan Jin, Wonbong Choi, Jungna Heo, Dongryul Jeon, and J.M. Kim
 Secondary Electron Emission Yields from MgO deposited on carbon nanotubes
J. Appl. Phys
89
4091
2001
15
N.S. Lee, D.S. Chung. I.T. han, J.H. Kang, Y.S. Choi, H.Y. Kim, S.H. Park, Y.W. Jin, W.K. Yi, M.J. Yun, J.E. Jung, C.J. Lee, J.H. You, S.H. Jo, C.G. Lee, and J.M. Kim
 Application of carbon nanotubes to field emission displays
Diamond Rel. Mat
10
265
2001
14
Whikun Yi, Taewon Jeon, Sunghwan Jin, SeGi Yu, Junghee Lee, and J.M. Kim
 Novel fabrication for microchannel plates
Rev. Sci. Instrum
71
265
2001
13
Whikun Yi, Sunghwan Jin, Taewon Jeong, Jeonghee Lee, SeGi Yu, Yongsoo Choi, and J.M. Kim
 Microchannel plate for high-efficiency field emission display
Appl. Phys. Lett
77
1716
2000
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